Appendix D Optimizing Throughout and Reading Rate 333
A Benchmark
The benchmark used to show the affect of the various functions of the 3458A
Multimeter will start with the most convenient, but least rapid, procedure of
having the computer ask the dmm to change to a particular function, make a
measurement, and transfer the measurement to the computer. The benchmark will
assume that all of the measurements will be made through a FET scanner of
infinitely fast switching speed and of infinite dynamic range. Hence, the
benchmark represents an artificial situation, but one where the different modes of
operation of the 3458A can be best illustrated. The computer used is the 9000
Series 200/300. Times for other computers will vary depending on the GPIB
turnaround time of the computer. Results are shown in Figure 49.
The DUT contains:
25 resistance measurements
15 < 10 kOhm ± 5%
8 < 100 kOhm ± 5%
2 < 10 kOhm ± .001%
10 DCV measurements
5 < 30 V± 1%
4 < 10 V± .01 %
1 < 1 V± .001%
3 ACV measurements
1 < 250 V @ 50 Hz @ ± 5%
1 < 10 V @ 25 kHz @ ± 0.1%
1 < 1 V @ 5 kHz @ ± 0.075%
The measurement sequence demands that the resistance values be checked before
the circuit is powered. Then, the powerline voltage is checked for proper level.
The output level 1 V at 5 kHz is checked to limits of ±.075%. Finally, the
remaining voltages are checked in the following sequence:
2 DCV <10 V ±1%
1 DCV <10 V ±.01%
2 DCV <10 V ±1%
Figure 49. Shows
benchmark execution
times for different
configurations.
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