RAD-...-IFS
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PHOENIX CONTACT 105542_en_05
1.6 Notes for individual I/O extension modules
For RAD-DI4-IFS, RAD-DOR4-IFS, RAD-DAIO6-IFS
For RAD-AO4-IFS
1.7 UL notes (RAD-2400-IFS and I/O extension
modules only)
For RAD-2400-IFS wireless module
For the I/O extension modules
WARNING: Risk of electric shock
Use the same phase for digital inputs and outputs. The isolating voltage between the in-
dividual channels must not exceed 300 V.
Use either the current or voltage output at every analog channel.
INDUSTRIAL CONTROL EQUIPMENT FOR HAZARDOUS LOCATIONS 45FP
A This equipment is suitable for use in ClassI, Zone2, IIC T4 and ClassI, Division2,
Groups A, B, C, D T4A hazardous locations or non-hazardous locations only.
B WARNING - EXPLOSION HAZARD - DO NOT DISCONNECT EQUIPMENT UN-
LESS POWER HAS BEEN SWITCHED OFF OR THE AREA IS KNOWN TO BE
NON-HAZARDOUS.
C WARNING - EXPLOSION HAZARD - SUBSTITUTION OF COMPONENTS MAY
IMPAIR SUITABILITY FOR CLASS 1, DIVISION 2.
D These devices are open-type devices that are to be installed in an enclosure suit-
able for the environment that is only accessible with the use of a tool.
E WARNING - Exposure to some chemicals may degrade the sealing properties of
materials used in relays within this device.
F WARNING - EXPLOSION HAZARD - S-PORT IS FOR MAINTENANCE AND
PROGRAMMING ONLY AND SHOULD ONLY BE USED WHEN THE AREA IS
KNOWN TO BE NON-HAZARDOUS.
INDUSTRIAL CONTROL EQUIPMENT FOR HAZARDOUS LOCATIONS 45FP
A This equipment is suitable for use in ClassI, Zone2, IIC T4 and ClassI, Division2,
Groups A, B, C, D T4A hazardous locations or non-hazardous locations only.
B WARNING - EXPLOSION HAZARD - DO NOT DISCONNECT EQUIPMENT UN-
LESS POWER HAS BEEN SWITCHED OFF OR THE AREA IS KNOWN TO BE
NON-HAZARDOUS.
C WARNING - EXPLOSION HAZARD - SUBSTITUTION OF COMPONENTS MAY IM-
PAIR SUITABILITY FOR CLASS 1, DIVISION 2.
D These devices are open-type devices that are to be installed in an enclosure suitable
for the environment that is only accessible with the use of a tool.
E WARNING - Exposure to some chemicals may degrade the sealing properties of ma-
terials used in relays within this device.
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