13-14 Status Structure
Measurement event status
The used bits of the measurement event register (shown in Figure 13-6) are described as
follows:
• Bit B1, low limit 1 fail (LL1F) — Set bit indicates that the low limit 1 test has failed.
• Bit B2, high limit 1 fail (HL1F) — Set bit indicates that the high limit 1 test has failed.
• Bit B3, low limit 2 fail (LL2F) — Set bit indicates that the low limit 2 test has failed.
• Bit B4, high limit 2 fail (HL2F) — Set bit indicates that the high limit 2 test has failed.
• Bit B5, limits pass (LP) — Set bit indicates that all limit tests passed.
• Bit B6, reading available (RAV) — Set bit indicates that a reading was taken and
processed.
• Bit B7, reading overflow (ROF) — Set bit indicates that the volts, amps, ohms or cou-
lombs reading exceeds the selected measurement range of Model 6514.
• Bit B8, buffer available (BAV) — Set bit indicates that there are at least two readings
in the buffer.
• Bit B9, buffer full (BFL) — Set bit indicates that the buffer is full.
ROF
(B7)
LP
(B5)
HL2F
(B4)
LL2F
(B3)
HL1F
(B2)
OR
BFL = Buffer Full
BAV = Buffer Available
ROF = Reading Overflow
RAV = Reading Available
LP = Limits Pass
& = Logical AND
OR = Logical OR
&
&
&
&
&
(B0)
&
128
(2
7
)
32
(2
5
)
16
(2
4
)
8
(2
3
)
4
(2
2
)
2
(2
1
)
Decimal
Weights
RAV
(B6)
(B15 - B10)
[:EVENt]?
64
(2
6
)
BFL
(B9)
BAV
(B8)
&
&
&
LL1F
(B1)
ROF
(B7)
LP
(B5)
HL2F
(B4)
LL2F
(B3)
HL1F
(B2)
Measurement
Condition Register
(B0)
RAV
(B6)
(B15 - B10)
:CONDition?
BFL
(B9)
BAV
(B8)
LL1F
(B1)
Measurement
Event Register
ROF
(B7)
LP
(B5)
HL2F
(B4)
LL2F
(B3)
HL1F
(B2)
(B0)
RAV
(B6)
(B15 - B10)
BFL
(B9)
BAV
(B8)
LL1F
(B1)
512
(2
9
)
256
(2
8
)
HL2F = High Limit 2 Fail
LL2F = Low Limit 2 Fail
HL1F = High Limit 1 Fail
LL1F = Low Limit 1 Fail
:ENABLe <NRf>
:ENABLe?
Measurement Event
Enable Register
To MSB bit
of Status Byte
Register
Figure 13-6
Measurement
event status