C-3
OP27,
OP37 Equipment Manual
Release 05/99
C.1.1 Individual Tests
Contrast Increase
or decrease the contrast of the selected
screen using the arrow keys depicted on the
right.
Brightness
Blank or brighten the screen by pressing the
arrow keys depicted on the right. This function
corresponds to the Blank Scr
een
function on
the
System Settings
standard screen.
Relay on/of
f
Press this button to activate and deactivate the
contact assembly integrated in the power sup
-
ply connector:
ENTER
The OP memory modules are checked by means of read/write tests.
Should an error occur
, the faulty memory address is displayed on the screen.
Note
W
ith SRAM, EEPROM and flash memory
, the memory contents are saved to
DRAM prior to testing. Consequently
, you should begin by testing the DRAM
for errors.
If the test reveals an error
, the data copied prior to the test is not re-imported.
This means that the content of the memory which failed the test is corrupted.
The same applies if the power supply fails.
The individual RAM tests:
RAM Test Initiated by Key Result
DRAM
K1
Test each bit in the memory area.
EPROM
F9
A checksum test is performed to validate
the integrity of the data stored in memory.
SRAM
F10
Test each bit in the memory area.
EEPROM
F11
Performing
settings on the
selection screen
Internal/External
memory
T
est Functions
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