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Tektronix MSO73304DX
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Learn about sampling modes.
Sampling modes
The acquisition system can process the data as it is acquired, averaging or enveloping the waveform data to produce enhanced
waveform records. Once the waveform record exists (enhanced or not), you can use the post processing capabilities of the
instrument to further analyze that record.
Refer to Acquisition Mode for a description of the acquisition modes.
Learn about waveform measurements.
Waveform record
While sampling on the input signal provides the data that makes up the waveform record for any given channel, the instrument
builds the waveform record through use of some common parameters ("common" means they affect the waveforms in all
channels).
The next figure shows how these common parameters define the waveform record. They define how much data is taken and the
location within the data stream. These parameters include the following:
â– 
Sample Interval. This is the time between sample points taken during acquisition.
â– 
Record Length. This is the number of samples required to fill a waveform record.
â– 
Trigger Point. The trigger point marks the reference zero time in a waveform record. All waveform samples are located in
time (minus and/or plus) with respect to the trigger point.
â– 
Horizontal Position. When horizontal delay is off, the horizontal position is the time from the first sample taken (first point in
the waveform record) to the trigger point (in percent of samples before the trigger). The trigger point and the horizontal
reference are at the same time in the waveform record.
When horizontal delay is on, the Horizontal Position knob controls the horizontal delay time. The horizontal delay is the time from
the trigger point to the horizontal reference.
Figure 20: The waveform record and its defining parameters (horizontal delay on)
Oscilloscope reference
DPO70000SX, MSO/DPO70000DX, MSO/DPO70000C, DPO7000C, and MSO/DPO5000B Series 661

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Tektronix MSO73304DX Specifications

General IconGeneral
BrandTektronix
ModelMSO73304DX
CategoryTest Equipment
LanguageEnglish

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