In this section:
Introduction .............................................................................. 7-1
Pulse generator tests ............................................................... 7-2
Signal connections ................................................................... 7-2
GPIB connections .................................................................... 7-4
Using KCon to add a Keysight pulse generator to the system . 7-4
HP8110ulib user library ............................................................ 7-5
Introduction
For details on all aspects of the HP pulse generator operation, refer to the Keysight Model 8110A
User’s Manual.
The 4200A-SCS can control a Keysight Model 8110A Pulse Generator to output from 1 to 65,535
pulses. The figure below shows an example pulse output. Timing parameters that can be set for the
output pulse include pulse delay time, pulse width, pulse period, pulse rise time, and pulse fall time.
Details on all parameters for the output pulse are provided in HP8110ulib user library (on page 7-5).
One of the applications for a pulse generator in a semiconductor characterization test system is stress
testing. The stress is a burst of pulses applied by the pulse generator to a semiconductor device,
such as a flash memory cell. The 4200A-SCS performs before-stress and after-stress
characterization tests on the device.
Figure 114: Pulse generator output example