Tektronix Keithley 4200A-SCS User Manual

Section 12: Using a Cascade Summit-12000 Prober Model 4200A-SCS Prober and External Instrument Control
12-12 4200A-913-01 Rev. A December 2020
Refer to the probesites and probesubsites Clarius project examples for specifics on selecting
sites to probe.
18. Click Next.
19. Specify the test sequence.
Figure 256: Step 6: Wafer Map Wizard
20. Click Finish.
21. Save the Wafer Map settings.
Create a site definition and define a probe list
Creating a site definition for a single subsite per die involves using the software to create a selection
of dies to probe. If a single subsite per site (die) is to be probed, refer to Probesites Clarius Project
example (on page 12-20).
Creating a site definition for multiple subsites per die involves using the software to create a selection
of dies to probe, but also includes creating a selection of the subsites for each site (die) that will be
probed. If multiple subsites per site will be probed, refer to Probesubsites Clarius Project example (on
page 12-23).

Tektronix Keithley 4200A-SCS Specifications

General

Brand	Tektronix
Model	Keithley 4200A-SCS
Category	Measuring Instruments
Language	English