Model
5528A
Parallelism
Measurements
CONTENTS
SECTION
14
PARALLELISM MEASUREMENTS
INTRODUCTION
HARDWARE REQUIRED
REFERENCE
MATERIAL
LINEAR PARALLELISM MEASUREMENTS
ROTATI
ONAL
PARALLEli
SM
MEASUREMENTS
INTRODUCTION
There are two types
of
" Parallelism" measurements -
"linear"
and
"Rotational
" . In any
Parallelism measurement, you compare the slopes
of
two
Straightness meas
urement,
measured
from the same Straightness Reflector
positon
.
A
"linear
Parallelism" measurement consists
of
two
Straightness measurement
s,
made along the
same
measurement
axis
but
with the
Interferometer
moving
in
the
one
meas
urement
and the
Reflec
tor
moving in the other measurement.
A
" Rotational
Para
llelism" measurement
is
made on a lathe. It consists
of
two
Straightness
measurements,
ea
ch made
with
the Reflector
held
in the lathe's s
pindle
(the
workpie
ce
location
),
but
with
the s
pindle
rotated
180
degrees
for
the s
econd
meas
urement.
HARDWARE REQUIRED
In
addition
to the hardware required
for
any measurement using the
Laser
Measurement
System
(
see
Figure 4-1
),
any Parallelism measurement
will
need all the same
hardware
as
required
for
a
Straightne
ss
measurement, plus a
Turning
Mirror
and possibly a Straightne
ss
Re
tr
orefle
c
tor
.
REFERENCE
MATERIAL
Phy
sic
al
Setup
of
the
La
ser Head and
Tripod
Se
c
tion
4
Inter
connections, Turn-on .
..................
,
..
,
...
,.................
Sec
tion
5
Straightness Measurements (
Along
a
Horizontal
Axis) .
........
.
...
.
....
Se
c
tion
10
Straightne
ss
Measurements (Using the Straightness
Retroreflector
)
......
Se
c
tion
11
Alignment Techniques
..
.
...........
.
...
. Sec
tion
15
LINEAR
PARALLELISM
MEASUREMENTS
With this type
of
Parallelism meas
urement
, you will make
tw
o S
traightne
ss
Mea
surements along
the same meas
urement
axi
s.
In one meas
urement
the Reflec
tor
will move and in the
other
the
Interferometer
will mo
ve.
14-1
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