Keithley 6430 User Manual

Limit Testing 11-13
Multiple-element device binning
Figure 11-8 shows a basic binning system to test three-element resistor networks. Note that
this system requires a scanner card that is installed in a switching mainframe. Scanner card
switching is controlled through the Trigger Link. End binning control is required for this test
system, therefore, the grading mode must be used.
Trigger operations for the scanner and SourceMeter must be configured appropriately for
this test. In general, the scanner must be configured to scan three channels, and the Source-
Meter must be configured to perform a 3-point sweep and output a trigger to the scanner after
each measurement. See Section 10 for details.
When the testing process is started, Ch 1 of the scanner card closes, and R1 is measured.
Two events occur concurrently after the measurement is completed: R1 is tested, and the
SourceMeter sends a trigger pulse to the switching mainframe causing Ch 1 to open and Ch 2
to close. Assuming there is no failure, a measurement is then performed on R2. While R2 is
being tested, Ch 2 opens and Ch 3 closes. Again assuming no failure, a measurement is per-
formed on R3 and it is then tested. Assuming that all the tests on all three resistors passed, the
device package is placed in the pass bin.
If any of the resistors in the network fails a test, the FAIL message is displayed, and the dig-
ital output information for the first failure is stored in memory (assuming that END binning
control is selected). After the sweep is completed, the SourceMeter sends the output pattern
stored in memory. This is the output pattern for the first test failure. The component handler
places the DUT package into the bin assigned to that particular failure.
The handler selects the next resistor network, and the testing process is repeated.
Switching Mainframe Handler
Trigger
Link
Scanner Card
Ch 1
Ch 2
Ch 3
Dig
In
Multi-Element
Device Package
R1
R2
R3
In/Out
HI LO
Trigger
Link *
Dig
I/O
6430
* Trigger layer configured to output trigger pulse after each measurement.
Figure 11-8
Binning system -
multiple element
devices

Keithley 6430 Specifications

General

Type	Sub-Femtoamp Remote SourceMeter
Compliance Voltage	200 V
Maximum Output Voltage	200 V
Maximum Output Current	100 mA
Compliance Limit	Programmable
Interface	GPIB, RS-232
Input Impedance	>10^14 Ω

Summary

Safety Precautions

3 Basic Source-Measure Operation

Basic Source-Measure Procedure

Details setup for source-measure operations: function, values, limits, and output control.

5 Source-Measure Concepts

Compliance limit

Discusses compliance limits, values, and determination.

Operating boundaries

Covers voltage/current boundaries for source, sink, I-source, V-source, and source-measure modes.

6 Range, Digits, Speed, and Filters

Range and digits

Discusses available ranges, limits, manual/autoranging, and display resolution.

Speed

Filters

Provides information on 3-stage filtering to reduce reading noise.

7 Relative and Math

Math Operations

Details math (FCTN) operations: power, offset ohms, varistor, etc.

9 Sweep Operation

Configuring and Running a Sweep

Discusses setup, configuration, delay setting, and performing sweeps.

10 Triggering

Trigger Model

Discusses trigger model, layers, event detection, delay, and device action.

Configuring Triggering

Details how to configure various triggering aspects.

Remote Triggering

Details remote trigger model, commands, and basic triggering example.

11 Limit Testing

Types of Limits

Discusses three limit types: compliance, coarse, fine; summarizes grading and sorting modes.

Configuring and Performing Limit Tests

Describes configuration for limit tests and typical test procedure.

Remote Limit Testing

12 Digital I/O Port, Interlock, and Output Configuration

Digital I/O Port

Safety Interlock

Describes using Digital I/O Port as a safety interlock.

Front Panel Output Configuration

14 Status Structure

Programming and Reading Registers

Status Byte and Service Request (SRQ)

Explains programming Status Byte for SRQs and using serial poll to detect SRQs.

15 Common Commands

Command Summary

Lists IEEE-488.2 common commands used by the SourceMeter.

Command Reference

Provides detailed reference for common commands, excluding status structure.

16 SCPI Signal-Oriented Measurement Commands

Command Summary

Configuring Measurement Function

Provides detailed info on commands to configure measurement function.

Acquiring Readings

Describes commands to acquire post-processed readings, trigger, acquire, and single measurement.

17 SCPI Command Reference

18 Performance Verification

Verification Test Requirements

Recommended Test Equipment

Performing the Verification Test Procedures

Details restoring factory defaults, setting ranges, and output values.

Mainframe Verification

Covers procedures to verify mainframe accuracy alone.

19 Calibration

Recommended Calibration Equipment

Unlocking Calibration

Mainframe Calibration

Includes procedures to calibrate the mainframe without the Remote PreAmp.

20 Routine Maintenance

Line Fuse Replacement

Covers procedure and part numbers for replacing the line fuse.

Front Panel Tests

F Measurement Considerations

Floating measurement safety concerns

Discusses safety concerns for measurements up to 42V above chassis ground.

Low current measurements

Leakage currents and guarding

Explains reducing leakage currents using insulators, humidity control, and guarding.