cycle. Once the trip output has operated the command text will revert to No Operation whilst the r
est of the
auto-reclose cycle is performed. To test subsequent three-phase autoreclose cycles, you repeat the Trip 3
Pole command. You can also test the single phases with Trip Pole A , Trip Pole B and Trip Pole B.
Note:
The default settings for the programmable scheme logic has the AR Trip Test signals mapped to the Trip Input
signals. If the programmable scheme logic has been changed, it is essential that these signals retain this mapping for the
Test Autoreclose facility to work.
3.10 STATIC TEST MODE
Static Test Mode can be set to Enabled or Disabled. When the S
tatic Test mode is enabled it allows injection
test that don't support dynamic switching to be used to commission and test the device.
Dynamic secondary injection test sets are able to accurately mimic real power system faults. The test sets mimic
an instantaneous fault “shot”, with the real rate of rise of current, and the decaying DC exponential component.
Dynamic injection test sets are available, which cater for all three phases, providing a six signal set of analogue
inputs: Va, Vb, Vc, Ia, Ib, Ic. Such injection test sets can be used with the device, with no special testing limitations.
Static test sets, also known as Static Simulators, may not properly provide or simulate:
● A healthy pre-fault voltage
● A real fault shot (instead a gradually varying current or voltage would be used)
● The rate of rise of current and DC components
● A complete set of three-phase analogue inputs
● Real dynamic step changes in current and voltage.
Some of the protection in this product is based on delta techniques which recognise step changes in actual power
system quantities. Because these may not be produced by static test sets,, certain functions are can be disabled or
bypassed to allow injection testing with static test sets. Enabling the Static Test Mode option does this..
For the tests, the delta directional line is replaced by a conventional distance directional line. Extra filtering of
distance comparators is used so the filtering slows to use a fixed one cycle window. Memory polarising is replaced
by cross-polarising from unfaulted phases.
Note:
Trip times may be up to ½ cycle longer when tested in the static mode, due to the nature of the test voltage and current, and
the slower filtering. This is normal, and perfectly acceptable.
3.11 LOOPBACK MODE
Loopback Mode can be used to test InterMiCOM
64
signalling.
Not
e:
If the cell is set to Internal, only the IED software is checked. If the cell is set to External, both the software and hardware
are checked.
When the device is switched into Loopback Mode, it automatically uses generic addresses 0-0. It responds as if it is
connected to a r
emote device. The sent and received IM
64
signals continue to be routed to and from the signals
defined in the programmable logic.
Note:
Loopback mode can also be selected by energising an opto-input mapped to the Loopback signal.
P54A/B/C/E Chapter 20 - Commissioning Instructions
P54xMED-TM-EN-1 451
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