11-6 Limit Testing Models 2500 and 2502 User’s Manual
Binning control
The binning control selection determines when the testing process stops and the appropri-
ate binning operation occurs. The results are communicated through the Digital I/O port
based on limit test data. (See “Binning systems,” page 11-10.) There are two types of bin-
ning control for the grading mode: immediate and end.
Immediate binning — Use immediate binning when you want to stop all testing after the
first failure occurs. Any pending tests will be cancelled, and the DUT will be placed in the
bin assigned to that test failure. If no failures occur, all enabled tests will be performed,
and the DUT will be placed in the assigned pass bin. This process is demonstrated in
Figure 11-3.
Using a sweep with immediate binning lets you test different devices at different source
levels. For example, assume a 3-point linear sweep at 1V, 2V, and 3V step levels. The first
DUT is tested at 1V, the second DUT is tested at 2V, and the third DUT is tested at 3V.
End binning — End binning allows a sweep to finish before performing the binning oper-
ation. In the event of a failure, the first test failure determines the bin assignment. (See
Figure 11-4.)
Using a sweep with end binning lets you test a device at different source levels. For exam-
ple, assume a 3-point list sweep at 1.1V, 2.2V, and 3.3V source levels. Limit testing will be
performed at each source level. After the completion of the three test cycles, the DUT is
placed in the appropriate bin.
Figure 11-3
Immediate binning
Figure 11-4
End binning
Test1 Test2 Test3
Pass Fail Pass
Digital I/O
Pass/Fail
Notification
Test1
(Pass)
Test2
(Fail)
Test3
(Pass)
Fail
Digital I/O
Notification
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