Model 2500 and 2502 User’s Manual Getting Started 1-27
Table 1-8
Limit configuration menu
Configuration menu item Description
CONFIG LIMIT
CONFIG LIMITS MENU
DIGOUT
SIZE
3-BIT
4-BIT
16-BIT (2499-DIGIO)
MODE
GRADING
IMMEDIATE
END
SORTING
AUTO-CLEAR
DISABLE
ENABLE
H/W-LIMITS
CONTROL
DISABLE
ENABLE
FAIL-MODE
IN
OUT
S/W-LIMITS
CONTROL
DISABLE
ENABLE
LOLIM
HILIM
PASS
FEED
PASS
DIGIO PATTERN
EOT-MODE
/BUSY
EOT
/EOT
Configure limit tests.
Program Digital I/O bit patterns for pass/fail.
Select I/O number of bits.
3-bit size.
4-bit size.
16-bit size (2499-DIGIO option only).
Select Digital I/O mode.
Pass if within HI/LO limits.
Stop test after first failure.
Stop test at end of sweep.
Fail if outside limits, program fail pattern.
Enable/disable auto clear.
Disable auto clear.
Enable auto clear, program pass/fail pattern.
Control and set fail mode for Limit 1, Limit 2 tests.
Control Limit 1 or 2 test.
Disable Limit 1 or 2 test.
Enable Limit 1 or 2 test.
Select Limit 1 or 2 fail mode.
Fail when in compliance, program bit pattern.
Fail when out of compliance, program bit pattern.
Control Limit 3 to Limit 6 tests.
Enable/disable Limit 3-6 tests.
Disable test.
Enable test.
Set low limit.
Set high limit.
Set pass Digital I/O bit pattern.
Select input path (MSR1, MSR2, RATIO, or DELTA).
Set limit test pass conditions.
Set pass conditions Digital I/O bit pattern.
Set Digital I/O line 4 to act as EOT or BUSY signal.
Set line 4 LO while unit is busy (3-bit mode).
Output line 4 HI pulse at end of test (3-bit mode).
Output line 4 LO pulse at end of test (3-bit mode).
Test Equipment Depot - 800.517.8431 - 99 Washington Street Melrose, MA 02176
TestEquipmentDepot.com