Models 2500 and 2502 User’s Manual SCPI Command Reference 17-33
Query :UPPer? Query specified upper limit
:UPPer? DEFault Query *RST default upper limit
:UPPer? MINimum Query lowest allowable upper limit
:UPPer? MAXimum Query largest allowable upper limit
:LOWer? Query specified lower limit
:LOWer? DEFault Query *RST default lower limit
:LOWer? MINimum Query lowest allowable lower limit
:LOWer? MAXimum Query largest allowable lower limit
Description These commands are used to set the upper and lower limits for the Limit
3 through Limit 6 tests (software limits).
SOURce3 <NRf> | <NDN>
:CALCulate7:LIMit[1]:COMPliance:SOURce3 <NRf> |<NDN>Specify pattern; Limit 1 failure
:CALCulate7:LIMit2:COMPliance:SOURce3 <NRf> |<NDN> Specify pattern; Limit 2 failure
:CALCulate7:LIMitx:LOWer:SOURce3 <NRf>|<NDN> Specify pattern for grading mode; lower
Limit x failure (x = 3-6)
:CALCulate7:LIMitx:UPPer:SOURce3 <NRf>|<NDN> Specify pattern for grading mode; upper
Limit x failure (x = 3-6)
Parameters <NRf> = 0 to 7 (3-bit) Decimal value
0 to 15 (4-bit) Decimal value
<NDN> = 0 to #b111 (3-bit) Binary value
0 to #b1111 (4-bit) Binary value
0 to #q7 (3-bit) Octal value
0 to #q17 (4-bit) Octal value
0 to #h7 (3-bit) Hexadecimal value
0 to #hF (4-bit) Hexadecimal value
Query :SOURce3? Query source value for specified limit
Description These commands are used to define the digital output fail patterns for
the specified tests (0 to 7, 3-bit; 0 to 15, 4-bit). Note that the fail patterns
for Limits 3-6 apply only to the grading mode.
Tests are performed in the following order:
1. Limit Test 1
2. Limit Test 2
3. Limit Test x, where x = 3-6 in ascending numerical order.
a. Lower Limit x
b. Upper Limit x
The first failure in the test sequence determines the bit pattern for the
digital output port. Subsequent failures in the test sequence will not
change the defined digital output pattern. Note that the output value can
be specified as a binary, octal, decimal, or hexadecimal value.
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