HP 3000 Series Handbook

For HP Internal Use Only
Table 5-40. Selftest Failure Codes
Test
WordO
All-purpose Chip DTACK
80010000
OCTART DTACK
80020000
LAN Controller DTACK
80030000
ISR DTACK
80040000
DMA Controller DTACK
80050000
Key DTACK
80060000
SRAM
80070000
DRAM
80080000
DRAM parity
81080000
Power-on SRAM
82070000
Power-on DRAM
82080000
Power-on DRAM parity
83080000
OCTART tests
80090000
D MA Controller register
800a0000
Key Chip register
800b0000
fw ROM tests
800c0000
EEPROM tests 800dnnnn
1
IODC ROM tests 800e0000
Backplane DMA 800fnnnn
1
LAN Controller tests
80100000
FLASH tests 80120000
fw patch test
80130000
All-purpose Chip register test
80140000
front panellb test
8015nnnn
1
fw fatal error
80160000
Spurious Interrupt occurred
80170000
parity test
80180000
Note
1
Subtests are indicated in this field. They are for internal use only.
i
Integrated Access Port Selftest Failure Codes
The Integrated Access Port (lAP) selftest failure messages appear as:
AP failed selftest number xx(APERR 05)
where xx is defined in Table 5-41 .
SE - Supervisor Element
OCTART - Chip containing 8 serial I/0 ports
QANAT - Bus interface chip
5-40 Troubleshooting

HP 3000 Series Specifications

General

Brand	HP
Model	3000 Series
Category	Desktop
Language	English