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Agilent Technologies InfiniiVision 3000 X-Series Programmer's Guide

Agilent Technologies InfiniiVision 3000 X-Series
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:SEARch Commands 28
Agilent InfiniiVision 3000 X-Series Oscilloscopes Programmer's Guide 827
:SEARch:SERial:IIC:MODE
(see page 1138)
Command Syntax
:SEARch:SERial:IIC:MODE <value>
<value> ::= {READ7 | WRITE7 | NACKnowledge | ANACk | R7Data2
| W7Data2 | RESTart | READEprom}
The :SEARch:SERial:IIC:MODE command selects the type of IIC
information to find in the Lister display:
READ7 — searches for 7- bit address frames containing
Start:Address7:Read:Ack:Data. The value READ is also accepted for
READ7.
WRITe7 — searches for 7- bit address frames containing
Start:Address7:Write:Ack:Data. The value WRITe is also accepted for
WRITe7.
NACKnowledge — searches for missing acknowledge events.
ANACk — searches for address with no acknowledge events.
R7Data2 — searches for 7- bit address frames containing
Start:Address7:Read:Ack:Data:Ack:Data2.
W7Data2 — searches for 7- bit address frames containing
Start:Address7:Write:Ack:Data:Ack:Data2.
RESTart — searches for another start condition occurring before a stop
condition.
READEprom — searches for EEPROM data reads.
When searching for events containing addresses, address values are
specified using the :SEARch:SERial:IIC:PATTern:ADDRess command.
When searching for events containing data, data values are specified using
the :SEARch:SERial:IIC:PATTern:DATA and
:SEARch:SERial:IIC:PATTern:DATA2 commands.
Query Syntax
:SEARch:SERial:IIC:MODE?
The :SEARch:SERial:IIC:MODE? query returns the currently selected mode.
Return Format
<value><NL>
<value> ::= {READ7 | WRITE7 | NACK | ANAC | R7D2 | W7D2 | REST
| READE}
See Also Chapter 28, “:SEARch Commands,” starting on page 777
NOTE
The short form of READ7 (READ7), READEprom (READE), and WRITe7 (WRIT7) do not
follow the defined Long Form to Short Form Truncation Rules (see page 1140).

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Agilent Technologies InfiniiVision 3000 X-Series Specifications

General IconGeneral
BrandAgilent Technologies
ModelInfiniiVision 3000 X-Series
CategoryTest Equipment
LanguageEnglish

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